Full text loading...
XRD patterns obtained from multilayer in as-deposited and annealed state. Substrate peaks are labeled “.”
STEM images of (a) as-deposited sample, (b) annealed sample, and (c) corresponding STEM-EDX line scans (start and end labeled “” and “”).
Higher-magnification single layer STEM images of (a) as-deposited sample and (d) annealed sample and corresponding Al and Ti STEM-EDX elemental maps, respectively, in [(b)–(c)] as-deposited state and [(e)–(f)] annealed state.
HR-TEM image and corresponding Fourier transformation pattern of the as-deposited sample.
Article metrics loading...