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Correlated reduction in micropipe cross sections in SiC growth
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10.1063/1.2998572
/content/aip/journal/apl/93/15/10.1063/1.2998572
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/15/10.1063/1.2998572
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Phase contrast image of MP group; (b) optical micrograph in transmission light of MP2 lying remotely from two MPs in contact; (c) variation in cross-section sizes along the axes of MP1 and MP2 from the group.

Image of FIG. 2.
FIG. 2.

The experimental (open circles) and simulated (curves 1–3) intensity profiles (the intensity in relative units via the distance across the MP image). The best agreement is achieved through a sequential adjustment in the pipe diameters perpendicular and parallel to the beam. The sample-scintillator distance is 45 cm. The transverse/longitudinal diameters are equal to (curve 1, ). For comparison, curve 2 shows the best fit for the circular cross section , while curve 3 is given for the intermediate case .

Image of FIG. 3.
FIG. 3.

(a) A model of contact-free reaction between two MPs realized through screw dislocation exchange. MP1 emits a dislocation with the Burgers vector , which moves to MP2, and is absorbed by it. (b) Dependence of the energy associated with the emission of a dislocation by a MP near a second MP on the normalized dislocation coordinate for , , and (from bottom to top). The energy is given in units of .

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/content/aip/journal/apl/93/15/10.1063/1.2998572
2008-10-13
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Correlated reduction in micropipe cross sections in SiC growth
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/15/10.1063/1.2998572
10.1063/1.2998572
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