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Observation of near total polarization in the ultrafast laser ablation of Si
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View: Figures


Image of FIG. 1.
FIG. 1.

Plasma emission spectrum of Si. Data were taken with a single pulse focused onto the crystal surface. The solid curve is the signal recorded with the CCD detector, without the polarizer in place. The points are the polarization spectrum obtained by measuring the spectrum with the polarizer in place. Nineteen spectra were recorded at 20° increments of the polarizer. The polarization was evaluated every , using least squares fits to the Malus plots.

Image of FIG. 2.
FIG. 2.

Effects of the laser conditions on the polarization spectrum. Panels on the left show the spectrum as a function of (a) pulse delay and (b) pulse energy for the laser focused on the surface. Right panels show the spectrum as a function of delay for the laser focused (c) above and (d) below the surface. The lists of symbols denote the curves in order from top to bottom.

Image of FIG. 3.
FIG. 3.

Fluorescence and polarization spectra extended into the ultraviolet. The fluorescence spectra (continuous red curves) were recorded with at the polarizer settings that gave the minimum (main panel) and maximum (left inset) transmission. The polarization spectrum (points) was determined from a fine scan of the polarizer, with an angular rotation of between spectra. The right inset shows that the polarization faithfully tracks the structure in the fluorescence spectrum.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Observation of near total polarization in the ultrafast laser ablation of Si