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PL and PLE spectra measured at 10 K for samples A, B, and G, respectively. The PLE detection energies of samples A, B, and C were 3.203, 3.128, and 3.283 eV, respectively.
PL spectra of UTIR InGaN/GaN MQWs measured by using (a) a He–Cd laser and (b) a Nd:YAG laser. The excitation power density was varied from and . The inset shows the surface emission geometry.
Spontaneous and SE spectra at RT with the edge emission geometry of (a) sample A, (b) sample B, and (c) sample G, respectively. The inset shows the edge emission geometry.
Integrated luminescence intensity as a function of the excitation power density for all samples at RT.
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