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XRD patterns of various thick PZT films: (a) , (b) , (c) , and (d) .
Thickness dependence of the degree of the (111)-preferably orientation and the remnant polarization of PZT films. The inset shows the hysteresis loop of PZT film.
Short-circuit photocurrent of the Pt/PZT/Pt capacitor changing with strength and direction of the poling field. Squares show the polarization-up state and circles the polarization-down state of PZT films. The inset shows the photocurrent curves with time of PZT film under the maximum poling voltage.
Thickness dependence of the photocurrent originated from (a) bulk polarization and (b) interface Schottky barrier. (c) is the total photocurrent in Pt/PZT/Pt capacitor in virgin state.
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