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(a) Schematic cross-sectional view of the transparent GIZO TFT NV memory structure. (b) STEM image (left side) and EDS element analysis (right side) of the stack of in the device channel center, where the inset image of diffraction pattern by TEM for GIZO channel is included.
The optical transmittance characteristics of IZO and GIZO/IZO on the glass substrate with buffer layer, where the inset photo image of transparent GIZO TFT NV memory sample is included.
(a) Program curves and (b) F-N tunneling program/erase mechanics for transparent GIZO TFT NV memory with the sandwich gate insulators structure of . Program curves of GIZO TFTs using (c) and (d) single layers as the gate insulator.
(a) Erase curves and (b) retention characteristics of transparent GIZO TFT NV memory after one-time program.
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