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Effects of buffer layer on memory properties of thin film
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10.1063/1.3013564
/content/aip/journal/apl/93/17/10.1063/1.3013564
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/17/10.1063/1.3013564
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD patterns of (a) as-deposited BTO, (b) annealed BTO, (c) BFMO, (d) BFMO/as-deposited BTO, and (e) BFMO/annealed BTO.

Image of FIG. 2.
FIG. 2.

characteristics of BTO on Si without and with annealing.

Image of FIG. 3.
FIG. 3.

Variation in the memory window with the applied voltage.

Image of FIG. 4.
FIG. 4.

(a) The typical curve of BFMO/annealed BTO/Si at . (b) curves of BFMO/annealed BTO/Si at various dc voltage ramp rates at . (c) Frequency dependency of curves of Au/BFMO/annealed BTO/Si at .

Image of FIG. 5.
FIG. 5.

characteristics of BFMO on (a) Si, (b) as-deposited BTO/Si, and (c) annealed BTO/Si.

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/content/aip/journal/apl/93/17/10.1063/1.3013564
2008-10-31
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effects of Bi2Ti2O7 buffer layer on memory properties of BiFe0.95Mn0.05O3 thin film
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/17/10.1063/1.3013564
10.1063/1.3013564
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