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Capacitance-voltage characterization of interfaces
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10.1063/1.3005172
/content/aip/journal/apl/93/18/10.1063/1.3005172
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/18/10.1063/1.3005172
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Capacitance- and conductance-voltage measurements on diameter MOS capacitors with HCl clean: (a) curves of -type GaAs capacitor, (b) curves of -type GaAs capacitor, (c) curves of -type GaAs capacitor, (d) curves of -type GaAs capacitor, (e) map of -type GaAs capacitor, (f) map of -type GaAs capacitor, (g) map of -type GaAs capacitor, and (h) map of -type GaAs capacitor. The lower graph shows the (HCl clean) derived from the four conductance maps, the arrows indicating which measurement measures the interface state density in what portion of the bandgap.

Image of FIG. 2.
FIG. 2.

Capacitance- and conductance-voltage measurements on diameter MOS capacitors with S-passivation and FGA: (a) curves of -type GaAs capacitor, (b) curves of -type GaAs capacitor, (c) curves of -type GaAs capacitor, (d) curves of -type GaAs capacitor, (e) map of -type GaAs capacitor, (f) map of -type GaAs capacitor, (g) map of -type GaAs capacitor, and (h) map of -type GaAs capacitor. The lower graph shows the (S-passivated) derived from the four conductance maps, the arrows indicating which measurement measures the interface state density in what portion of the bandgap.

Image of FIG. 3.
FIG. 3.

More common representation of a subset of the conductance data from Fig. 1(g): as a function of frequency for different gate bias voltages.

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/content/aip/journal/apl/93/18/10.1063/1.3005172
2008-11-03
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Capacitance-voltage characterization of GaAs–Al2O3 interfaces
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/18/10.1063/1.3005172
10.1063/1.3005172
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