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Transition layers at the interface
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10.1063/1.2949081
/content/aip/journal/apl/93/2/10.1063/1.2949081
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/2/10.1063/1.2949081
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

HRTEM image of the interface revealing the transition layers and on the and SiC sides of the interface, respectively.

Image of FIG. 2.
FIG. 2.

(a) -contrast STEM image of the interface. Each of the EEL spectra is collected from a rectangular area of and the arrow indicates the sequence of the area scans (from 1 to 9). Spatially resolved EEL spectra containing the (b) edge , (c) edge .

Image of FIG. 3.
FIG. 3.

Low angle annular dark field STEM image of the interface. Note the nonuniform thickness of the brighter band at the top SiC surface that can be correlated with the nonuniformity of the excess carbon at these regions.

Image of FIG. 4.
FIG. 4.

(a) HAADF image of the interface. (b) Profiles of the and ratios as measured using EELS. Note the increased carbon content on both sides of the interface which correlates with the interfacial transition layers displaying a distinct contrast in Fig. 1.

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/content/aip/journal/apl/93/2/10.1063/1.2949081
2008-07-17
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Transition layers at the SiO2∕SiC interface
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/2/10.1063/1.2949081
10.1063/1.2949081
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