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HRTEM image of the interface revealing the transition layers and on the and SiC sides of the interface, respectively.
(a) -contrast STEM image of the interface. Each of the EEL spectra is collected from a rectangular area of and the arrow indicates the sequence of the area scans (from 1 to 9). Spatially resolved EEL spectra containing the (b) edge , (c) edge .
Low angle annular dark field STEM image of the interface. Note the nonuniform thickness of the brighter band at the top SiC surface that can be correlated with the nonuniformity of the excess carbon at these regions.
(a) HAADF image of the interface. (b) Profiles of the and ratios as measured using EELS. Note the increased carbon content on both sides of the interface which correlates with the interfacial transition layers displaying a distinct contrast in Fig. 1.
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