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Electrical investigation of -defects in GaN using Kelvin probe and conductive atomic force microscopy
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10.1063/1.2953081
/content/aip/journal/apl/93/2/10.1063/1.2953081
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/2/10.1063/1.2953081
/content/aip/journal/apl/93/2/10.1063/1.2953081
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/content/aip/journal/apl/93/2/10.1063/1.2953081
2008-07-16
2014-12-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electrical investigation of V-defects in GaN using Kelvin probe and conductive atomic force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/2/10.1063/1.2953081
10.1063/1.2953081
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