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The influence of stoichiometry on the structural stability and on the optical emission of erbium silicate thin films
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10.1063/1.2957034
/content/aip/journal/apl/93/2/10.1063/1.2957034
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/2/10.1063/1.2957034
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Er RBS signal of (a) , (b) mixture, and (c) , as deposited and after annealing treatments at for in and ambient.

Image of FIG. 2.
FIG. 2.

XRD spectra of (a) annealed in and ambient and -treated mixture, (b) mixture and , both annealed in ambient, and (c) treated in . Open squares, open circles, and full circles indicate the diffraction peaks associated to the phase of Ref. 11, the phase of Ref. 13, and the phase of Ref. 14, respectively.

Image of FIG. 3.
FIG. 3.

High resolution PL spectra obtained at by exciting with the line of an laser (a) -treated , (b) -treated , and (c) -treated , crystallized respectively in the phase of , a mixture of and phases of and the phase of . The spectra are offset for clarity; the used scaling factors are indicated.

Image of FIG. 4.
FIG. 4.

Integrated room temperature PL intensity (full symbols) and lifetime (open symbols) as a function of the Si:Er atomic ratio for Er silicates films thermally treated in (circles) and (triangles) ambient. The lines are drawn to guide the eye.

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/content/aip/journal/apl/93/2/10.1063/1.2957034
2008-07-18
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The influence of stoichiometry on the structural stability and on the optical emission of erbium silicate thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/2/10.1063/1.2957034
10.1063/1.2957034
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