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Minority carrier lifetime in polycrystalline silicon solar cells studied by photoassisted Kelvin probe force microscopy
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10.1063/1.2957468
/content/aip/journal/apl/93/2/10.1063/1.2957468
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/2/10.1063/1.2957468
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic illustration of waveforms of (a) light intensity and (b) corresponding photovoltage as a function of time .

Image of FIG. 2.
FIG. 2.

Experimental setup of our P-KFM system.

Image of FIG. 3.
FIG. 3.

(a) An optical micrograph of the polycrystalline silicon solar cell sample and (b) the temporally averaged photovoltage normalized by (the photovoltage under continuous illumination) as a function of the modulation frequency (: is the modulation period) measured at point A indicated in (a).

Image of FIG. 4.
FIG. 4.

(a) Intrinsic surface potential under dark condition, (b) photovoltage during continuous light illumination at a wavelength of and (c) lifetime at points A–E indicated in Fig. 3(a).

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/content/aip/journal/apl/93/2/10.1063/1.2957468
2008-07-14
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Minority carrier lifetime in polycrystalline silicon solar cells studied by photoassisted Kelvin probe force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/2/10.1063/1.2957468
10.1063/1.2957468
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