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XRF spectra of GaGdN layers vertically shifted for clarity.
XANES at the Gd edge of GaGdN layers. The inset shows the first derivative of the XANES intensities. For comparison, various standards (, Gd foil, and ab initio full multiple scattering simulation by FEFF8 code) have been included.
XANES and XLD signals recorded at the Gd and Ga edges from the GaN layer with 0.027% Gd content. The calculated XANES spectra are also plotted with the corresponding XLD.
Fourier transforms of the Ga edge EXAFS signal. The inset shows the -weighted EXAFS data (circles) and fitting functions (solid lines) in the momentum space.
Fitting parameters extracted from the spectra recorded at the Ga edge in layers.
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