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Right side: SEM with EDS line scan shown as arrow (top) and experimental and calculated powder XRD patterns (bottom) of . Left side: intensity of characteristic x-ray emission of different elements along the line scan.
Effects of substitutions on the temperature dependence, from of (a) the Seebeck coefficient, (b) the electrical resistivity, and (c) the power factor in complex MCoSb. ○ (-type), ● , ◆ , ▼ , ▼ , ▲ , and .
Total thermal conductivity (◇) and (◆) measured from for .
Hall coefficient , carrier concentration ( or ) and Hall mobility of alloys at .
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