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High resolution x-ray curves around the (004) reflection for samples ref (gray) and (black). Inset: (Ga,Mn)(As,P) lattice mismatch evolution with the BEP ratio.
(a) Temperature dependence of the remanent magnetization (dash line, left axis) and the longitudinal resistivity (solid lines, right axis) for annealed sample . For comparison, the resisitivity is also plotted for as-grown sample and annealed sample ref. (b) Transverse resistivity vs magnetic field, applied along the growth axis for the reference sample at . (c) Magnetization vs magnetic field, applied out-of-plane along  (squares) or in-plane along ⟨110⟩ (circles) at . (d) Transverse resistivity vs magnetic field, applied , for sample at different temperatures.
Successive snapshots of the magnetization reversal in sample at , observed by Kerr microscopy, after having applied a series of two (a), six (b), and ten (c) field pulses of amplitude and duration .
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