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Electrical characterization of gold island films: A route to control of nanoparticle deposition
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10.1063/1.3027463
/content/aip/journal/apl/93/20/10.1063/1.3027463
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/20/10.1063/1.3027463
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

SEM images of discontinuous Au films on SiN with thicknesses, , of (a) 2 nm, (b) 4 nm, (c) 6 nm, and (d) 10 nm. The same scale bar applies to all of (a)–(d).

Image of FIG. 2.
FIG. 2.

Measured resistance vs during deposition (full line) and resistance calculated using Eq. (1) (circles). The data for are noisy because the leakage resistance makes the accurate measurement difficult.

Image of FIG. 3.
FIG. 3.

Resistance vs time during the deposition of 3.6 nm diameter Pd clusters on a sensor with . The arrow indicates the end of the deposition. Short dashes: results of resistance model using ; long dashes: results of resistance model using .

Image of FIG. 4.
FIG. 4.

Mean Au island diameter, (diamonds, left scale), fitted with Eq. (4) (solid line), and coverage (circles, right scale), fitted with Eq. (5) (dashed line) vs . Measurement uncertainties are smaller than the data points except where shown.

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/content/aip/journal/apl/93/20/10.1063/1.3027463
2008-11-20
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electrical characterization of gold island films: A route to control of nanoparticle deposition
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/20/10.1063/1.3027463
10.1063/1.3027463
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