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Valence band offset of the ZnO/AlN heterojunction determined by x-ray photoemission spectroscopy
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10.1063/1.3032911
/content/aip/journal/apl/93/20/10.1063/1.3032911
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/20/10.1063/1.3032911
/content/aip/journal/apl/93/20/10.1063/1.3032911
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/content/aip/journal/apl/93/20/10.1063/1.3032911
2008-11-20
2014-12-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Valence band offset of the ZnO/AlN heterojunction determined by x-ray photoemission spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/20/10.1063/1.3032911
10.1063/1.3032911
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