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Schematic diagram of SThM probe in contact with sample and various heat transfer paths around the probe.
Scanning electron micrographs of full silicon oxide SThM probe: Au–Cr junction at end of tip (left) and top view (right).
Cantilever deflection and temperature measured by SThM probe as function of sample vertical position when Al heater line was raised toward the tip.
Difference between temperature of sample and temperature measured by SThM tip in contact mode as a function of temperature jump during tip-sample contact.
Modeled temperature profile, temperature profile obtained by double scan technique, temperature profile in contact mode, and profile in lift mode.
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