Full text loading...
(a) X-ray diffraction from films on and . (b) Field-cooled total moment data for after subtracting a positive temperature-independent substrate signal above 80 K.
(a) Comparison of edge of films on LAO and STO. Data from bulk are included for comparison to determine Co valence. (b) Bulk sensitive absorption and XMCD measured at the edge at and . (c) Field dependent XMCD at measured from 5 to 0 T.
Comparison of zero field electrical transport measurements showing a highly insulating state above 100 K for films on both STO and LAO.
Article metrics loading...