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Effects of thermal annealing on noise property and temperature coefficient of resistance of single-walled carbon nanotube films
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10.1063/1.3035848
/content/aip/journal/apl/93/21/10.1063/1.3035848
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/21/10.1063/1.3035848
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Typical vs frequency curves measured on a representative (a) 90 nm thick purified and (b) 100 nm thick COOH-functionalized SWCNT films. The inset of (a) shows the configuration of measurement system.

Image of FIG. 2.
FIG. 2.

Comparisons of vs bias current curves before and after annealing for the same (a) purified and (b) functionalized SWCNT films shown in Fig. 1. The insets show the SEM images before annealing.

Image of FIG. 3.
FIG. 3.

(a) as function of the film thickness for purified SWCNT films. The inset shows the variation in vs thickness. (b) Comparison of TCR-T curves of a 90 nm thick purified SWCNT film and a 100 nm thick COOH-functionalized SWCNT film. (c) Variation in TCR vs temperature for 10, 20, 50, and 90 nm thick purified SWCNT films before annealing. Inset shows the variation in TCR (at room temperature) vs film thickness for these samples. (d) Derived correlation between and TCR absolute value (at room temperature) for purified SWCNT films.

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/content/aip/journal/apl/93/21/10.1063/1.3035848
2008-11-24
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effects of thermal annealing on noise property and temperature coefficient of resistance of single-walled carbon nanotube films
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/21/10.1063/1.3035848
10.1063/1.3035848
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