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The investigation of capture/emission mechanism in high- gate dielectric soft breakdown by gate current random telegraph noise approach
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10.1063/1.3036681
/content/aip/journal/apl/93/21/10.1063/1.3036681
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/21/10.1063/1.3036681
/content/aip/journal/apl/93/21/10.1063/1.3036681
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/content/aip/journal/apl/93/21/10.1063/1.3036681
2008-11-24
2014-10-31
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The investigation of capture/emission mechanism in high-k gate dielectric soft breakdown by gate current random telegraph noise approach
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/21/10.1063/1.3036681
10.1063/1.3036681
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