1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Piezoresponse force microscopy on doubly clamped nanowires
Rent:
Rent this article for
USD
10.1063/1.3000385
/content/aip/journal/apl/93/22/10.1063/1.3000385
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/22/10.1063/1.3000385
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

[(a) and (b)] Schematic illustration of the fabrication process. (c) SEM image of a sample with reference AMs and randomly dispersed nanowires. This image has been used to pattern the electrodes of the final device shown in (d), see dashed box in (c). For more information, see text.

Image of FIG. 2.
FIG. 2.

(a) Illustration of the modified piezoresponse force microscopy measurement setup, and [(b) and (c)] contact-mode AFM topographic image of the fabricated nanowire structure.

Image of FIG. 3.
FIG. 3.

PFM measurements and finite element simulation results. (a) Amplitude and (b) phase images of the piezoelectric response of the nanowire under lateral electrical fields. (c) An illustration of possible domain patterns of the studied KN nanowire. (d) Simulated electrostatic potential profile in a cross-sectional plane along the nanowire. (e) AFM tip deflection at selected points [crosses in (a)]. (f) Integrated electric field components as a function of the AFM tip position.

Image of FIG. 4.
FIG. 4.

Linear dependence of the deflection amplitude as a function of the applied ac voltage measured at a fixed point on the nanowire.

Loading

Article metrics loading...

/content/aip/journal/apl/93/22/10.1063/1.3000385
2008-12-01
2014-04-20
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Piezoresponse force microscopy on doubly clamped KNbO3 nanowires
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/22/10.1063/1.3000385
10.1063/1.3000385
SEARCH_EXPAND_ITEM