Full text loading...
XRD patterns of Ag-PTO composite thin films heated in reducing atmosphere at with molar ratio of and .
SEM images of the thin films with molar ratio of (a) and (b) .
(a) UV-vis spectra of Ag-PTO composite thin films heated in reducing atmosphere at with different molar ratio of and (b) plots of both the expected-Ag/PTO and Ag-nanoparticle/PTO volume ratios as functions of mole ratio in the composite thin films. The open squares represent the expected volume of Ag in unit volume of PTO and the filled ones represent the Ag-nanoparticle/PTO volume ratio, respectively.
Dependence of the effective dielectric constant and dielectric loss of the Ag-PTO thin films (a) with and (b) without formation of Ag nanoparticles on applied frequency and molar ratio of . The comparison of dielectric constant dependence on molar ratio between the two thin films shown in (a) and (b) at frequency of is revealed in (c).
Plot of dielectric constant as a function of Ag volume fraction in the thin film. The filled squares represent the experimental data, the solid line is a curve calculated from Eq. (2) and the dashed line denotes the percolation threshold .
Article metrics loading...