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(a) The fabricated TRRAM device and (b) its transmittance in the visible region. The inset shows a schematic diagram of the structure.
An XRD spectrum of a ZnO thin film deposited on glass.
Typical characteristics of a TRRAM device. The inset shows the initial electroforming.
(a) Retention and (b) switching cycling characteristics for the HRS and LRS at room temperature as measured at .
(a) The log-log plot of in the LRS and (b) in the HRS. The inset shows the Poole–Frenkel emission at the high voltage region in the HRS.
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