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Erratum: “Degradation studies on high-voltage-driven organic light-emitting device using in situ on-operation method with scanning photoelectron microscopy” [Appl. Phys. Lett.93, 133310 (2008)]
18.J.-H. Lee, H.-J. Shin, J.-S. Lim, and H.-J. Song, U.S. Patent No. 7148719 B2 (2006).
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