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Determining the terahertz optical properties of subwavelength films using semiconductor surface plasmons
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10.1063/1.3049350
/content/aip/journal/apl/93/24/10.1063/1.3049350
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/24/10.1063/1.3049350
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Figures

Image of FIG. 1.
FIG. 1.

(a) The electric field associated with a SP on InSb is much more strongly confined to the surface than for the terahertz frequency surface eigenmode on gold. (b) Diagram of the measurement geometry.

Image of FIG. 2.
FIG. 2.

(a) The measured change in dispersion (symbols) of a SP on an InSb substrate induced by various thicknesses of polystyrene. Solid lines indicate the results of analytical modeling. The dispersion shift increases rapidly as the excitation frequency approaches the surface plasma frequency (at 1.7 THz). Measurement bandwidth is limited to 1.2 THz by the propagation length of the SP. (b) Equivalent results for a gold substrate. Dashed lines are the results of finite element modeling of the system that includes the effects of input and output coupling blade apertures. Inset: analytical modeling for the gold substrate underestimates the change in dispersion by almost an order of magnitude.

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/content/aip/journal/apl/93/24/10.1063/1.3049350
2008-12-19
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determining the terahertz optical properties of subwavelength films using semiconductor surface plasmons
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/24/10.1063/1.3049350
10.1063/1.3049350
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