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AFM cross section of the NiO thick sample before (a) and after (b) annealing.
3D AFM image of the thick NiO sample after heating (a) and the cross-sectional view (b) along the line as indicated in (a).
Dependence of in-plane domain size (a) and out-of-plane domain size (b) on temperature for the 10 and thick NiO films.
vs . Arrhenius plot of NiO transformation from an epitaxial thin film to a nanotape structure.
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