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Topographic AFM measurement in tapping mode of samples graphitized at (a) , a typical diameter flake of FLG (confirmed by its Raman signature) is visible while outside the flake the SiC steps are visible and (b) at , the full wafer is covered by FLG (as determined by Raman spectroscopy).
Summary of results collected on sample B. (a) Wide range optical microscope view of the sample with the flakes clearly visible, (b) SEM picture of the same sample, the darker flakes visible at SEM are the brighter seen at the optical microscope and correspond to a higher number of graphene layers. (c)–(e) are, respectively, the AFM measurement in tapping mode of the topography of the surface, the amplitude corresponding to contours, and the phase measurement.
(a) Wide range crossed polarized OM view of sample C, graphitized at and (b) the same area investigated in dark field mode. (c) is the superposition of (a) and (b) highlighting the correspondence between the thicker areas and the dislocations acting as chimneys. (d) Raman spectra collected on the same sample in three different parts: in the bright thin continuum (bottom spectrum), in the dark sublimation chimney (top spectrum), and in a gray intermediate part (middle). From bottom to top, the number of FLG increases by, typically, a factor of 10.
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