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(a) scan. The intensity close to is due to the strong peak as well as fringes due to the film. The intensity close to is governed by the film. (b) CTR analysis of the film close to . The positions of Bragg peaks due to bulk as well as are also marked.
In-plane scan. Bragg peaks of the film and the Si substrate are at and , respectively. Si CTRs are at at and . Positions of bulk and are marked.
scan. All peaks and fringes are due to -oriented except the strong peak at due to Si.
Model for with silicate film at the interface and lateral phase separation of (left) and (right).
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