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Effect of waveguide sidewall roughness on the threshold current density and slope efficiency of quantum cascade lasers
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10.1063/1.2962984
/content/aip/journal/apl/93/3/10.1063/1.2962984
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/3/10.1063/1.2962984
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Scanning electron micrographs of two waveguides with different values of roughness standard deviation, (left) and (right).

Image of FIG. 2.
FIG. 2.

(a) Mode intensity and refractive index profiles for the 7 and two-wavelength QC laser waveguide. (b) Mode intensity and refractive index profiles for the 9 and two-wavelength QC laser waveguide.

Image of FIG. 3.
FIG. 3.

Light-current-voltage curves for the QC laser for waveguides with (solid line) and (dashed line) measured in pulsed mode ( pulse width at repetition rate) at . A threshold current of for corresponds to a threshold current density of , and a threshold current of for corresponds to .

Image of FIG. 4.
FIG. 4.

(a) Threshold current density vs roughness standard deviation for the 7.0 and two-wavelength QC laser cavity. The solid lines are the result of a curve fit identical to Eq. (2), for data and for data. (b) Threshold current density vs roughness standard deviation plots for the 8.7 and two-wavelength QC laser cavity, with curve fit equations, for data and for data. The size of the symbols represents the average ridge width (ranging from ) of the respective rough waveguides, with wider ridges represented by larger symbols, and error bars represent the variation in calculating due to variation in ridge width because of roughness features.

Image of FIG. 5.
FIG. 5.

Slope efficiency vs roughness standard deviation for the 7.0 and and 8.7 and two-wavelength QC laser cavities. Solid lines are curve fits based on an expression identical to Eq. (3); for data, for data, for data, and for data. The size of the symbols represents the average ridge width (ranging from ) of the respective rough waveguides, with wider ridges represented by larger symbols.

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/content/aip/journal/apl/93/3/10.1063/1.2962984
2008-07-21
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effect of waveguide sidewall roughness on the threshold current density and slope efficiency of quantum cascade lasers
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/3/10.1063/1.2962984
10.1063/1.2962984
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