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The SEM images of (a) device A and (b) device B, and the impedance spectra measured from (c) device A and (d) device B, respectively, at under air (solid squares). Also included in (c) is the impedance spectrum measured under hydrogen at (open squares). The semicircles marked in red in (c) and (d) indicate the fitting result. The insets in (c) and (d) are the relevant equivalent circuits used for the fitting. The scale bars shown in (a) and (b) indicate 1 micrometer.
An Arrhenius plot of the resistance in the arm of the ZnO-T measured using device B.
The Arrhenius plots of the resistances corresponding to arc 1 and arc 2 shown in Fig. 1(c) measured using (a) the terminals I-II, (b) the terminals II-III, (c) the terminals II-III, and (d) the plot consists of (a), (b), and (c).
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