1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Enhancement of thermoelectric properties of sputtered Bi–Sb–Te thin films by electric current stressing
Rent:
Rent this article for
USD
10.1063/1.2965487
/content/aip/journal/apl/93/4/10.1063/1.2965487
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/4/10.1063/1.2965487
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Seebeck coefficient and electrical resistivity and (b) carrier concentration and mobility of the electrically and thermally treated Bi–Sb–Te films measured at room temperature as a function of annealing temperature.

Image of FIG. 2.
FIG. 2.

SEM images of the sputtered Bi–Sb–Te thin films after annealing at 230, 270, and for , respectively, [(a)–(c)] without electric current introduction and [(d)–(f)] with simultaneous electric stressing at a current density of .

Image of FIG. 3.
FIG. 3.

Experimental and theoretical Seebeck coefficients of the electrically and thermally treated Bi–Sb–Te films as a function of carrier concentration.

Loading

Article metrics loading...

/content/aip/journal/apl/93/4/10.1063/1.2965487
2008-07-28
2014-04-25
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Enhancement of thermoelectric properties of sputtered Bi–Sb–Te thin films by electric current stressing
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/4/10.1063/1.2965487
10.1063/1.2965487
SEARCH_EXPAND_ITEM