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Direct observation of oxygen movement during resistance switching in NiO/Pt film
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10.1063/1.2966141
/content/aip/journal/apl/93/4/10.1063/1.2966141
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/4/10.1063/1.2966141
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Schematic diagram of C-AFM measurement setup. (b) Typical curves of structure. (c) Simultaneously observed topographic image and (d) current image of film.

Image of FIG. 2.
FIG. 2.

Current images of film. Before observation, fourfold overwriting was performed (a) in the air and (b) in a vacuum.

Image of FIG. 3.
FIG. 3.

(a) Current image and [(b)–(d)] TOF-SIMS secondary ion images of the film which was written in gas atmosphere. (e) TOF-SIMS depth profile of ions and (f) comparative plot of ion counts performed at unwritten writing and writing regions. (g) Schematic of oxygen movement in HRS and LRS.

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/content/aip/journal/apl/93/4/10.1063/1.2966141
2008-07-29
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Direct observation of oxygen movement during resistance switching in NiO/Pt film
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/4/10.1063/1.2966141
10.1063/1.2966141
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