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Magnetic properties of the insulating ferromagnetic phase in strained thin films
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View: Figures


Image of FIG. 1.
FIG. 1.

Temperature dependence of magnetization in a weak magnetic field perpendicular to the film plane [(a) and (b)] and magnetic field dependence of the magnetization at [(c) and (d)].

Image of FIG. 2.
FIG. 2.

Magnetization hysteresis curves in a moderate field after ZFC to and after a measurement of a loop at .

Image of FIG. 3.
FIG. 3.

Comparison of Kerr rotation and magnetization loops [(a) and (c)] and Kerr ellipticity and ZFC magnetization loops [(b) and (d)] at . Error bars of at photon energy represent the systematic error corresponding to a residual linear component, which originates in the uncertainty of the subtracted window Faraday rotation. Error bars are omitted for at since the residual linear component has the same magnitude as at . The systematic error of is negligible in comparison to the noise present in the data.

Image of FIG. 4.
FIG. 4.

The difference between magnetization loops measured after and before field exposure.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Magnetic properties of the insulating ferromagnetic phase in strained Pr0.6Ca0.4MnO3 thin films