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Effects of metal electrodes on the resistive memory switching property of NiO thin films
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10.1063/1.2967194
/content/aip/journal/apl/93/4/10.1063/1.2967194
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/4/10.1063/1.2967194
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The characteristics of NiO films using Pt (black), Ta (red), and (green) top metal electrode (a) at the as-deposition state (b) after one day. All samples have a Pt bottom electrode.

Image of FIG. 2.
FIG. 2.

Ellingham diagram plotting the standard free energies of the formation of oxides of the metals mentioned in manuscript.

Image of FIG. 3.
FIG. 3.

(a) Comparison of the resistance values after a reset process and the characteristics of (black square), (red circle), and (green triangle). (b) characteristics of a NiO film with a Ag top electrode.

Image of FIG. 4.
FIG. 4.

X-ray photoelectron spectra of (a) and , and (b) and . , , , and in (a) correspond to the blue, green, red, brown lines, respectively. For confirming clear peak position, the XPS spectrum was fitted by using a combination of Gaussian (70%) and Lorentzian (30%) distributions (gray dashed lines). The curves fit for peaks were obtained using a fixed amplitude ratio with a minimum number of doublets in order to fit the experimental curves. In (b), and peaks at 374.1 and 368.1 eV indicate .

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/content/aip/journal/apl/93/4/10.1063/1.2967194
2008-08-01
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effects of metal electrodes on the resistive memory switching property of NiO thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/4/10.1063/1.2967194
10.1063/1.2967194
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