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X-ray diffraction study of polycrystalline thin films under electric field
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10.1063/1.2967736
/content/aip/journal/apl/93/4/10.1063/1.2967736
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/4/10.1063/1.2967736
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

2D-XRD patterns of polycrystalline BFO thin films using radiation.

Image of FIG. 2.
FIG. 2.

hysteresis loops of polycrystalline BFO thin films at room temperature.

Image of FIG. 3.
FIG. 3.

Diffracted x-ray intensity profiles as a function of time (a) at the BFO diffraction peak (: 14.500°) under , width, and period pulse application and (b) at the BFO diffraction peak (: 20.440°) under , width, and period pulse application.

Image of FIG. 4.
FIG. 4.

Voltage dependence of XRD patterns around (a) the BFO diffraction peak and (b) the BFO diffraction peak under width and period pulse application.

Image of FIG. 5.
FIG. 5.

Voltage dependence of electric-field-induced strain of (a) - and (b) -oriented domains.

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/content/aip/journal/apl/93/4/10.1063/1.2967736
2008-08-01
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: X-ray diffraction study of polycrystalline BiFeO3 thin films under electric field
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/4/10.1063/1.2967736
10.1063/1.2967736
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