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Separation modes in microcontacts identified by the rate dependence of the pull-off force
1.M. Rebeiz and J. B. Muldavin, IEEE Microw. Mag. 12, 59 (2001).
2.L. Chen, N. E. McGruer, and G. G. Adams, Proceedings of ASME/STLE International Joint. Tribology Conference, Long Beach, CA, 2004 (unpublished), Paper No. TRIB 2004-64347.
4.N. E. McGruer, G. G. Adams, L. Chen, Z. Guo, and Y. Du, Proceedings of IEEE Microelectromechanical Systems, Turkey, 2006 (unpublished), p. 230.
6.L. Chen, Y. Du, N. E. McGruer, and G. G. Adams, Solid State Sensors, Actuators, and Microsystems Workshop, Hilton Head Island, South Carolina, 1–5 June 2008 (unpublished), pp. 186–189.
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