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Schematic representation of the heteroepitaxial growth of thin film on cubic substrate. The layer’s  and directions are aligned along  and  directions of the substrate.
Reciprocal lattice maps of layers grown on (a) and (b) single crystal substrates. on clearly shows an orthorhombic unit cell, while layer on is tetragonal. Here we used , where is the Bragg angle and . Indices of the layer’s reflections are shown in bold.
Schematic representation of (a) orthorhombic and (b) tetragonal structures of . In the orthorhombic SRO, octahedra are rotated counterclockwise about  and  directions and clockwise about  direction. In the tetragonal structure octahedra are rotated around  direction.
Resistivity as a function of temperature of and thin films grown on different substrates. SRO on DSO and CRO on STO layers affected by a higher tensile strain are tetragonal and exhibit larger resistivity values, while orthorhombic SRO on STO and CRO on NGO layers show smaller resisitivity values.
Main structural parameters of and thin films grown on , , and single crystal substrates. and angles are equal to 90°.
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