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Nonlinear characteristics of T-branch junctions: Transition from ballistic to diffusive regime
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10.1063/1.2968129
/content/aip/journal/apl/93/5/10.1063/1.2968129
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/5/10.1063/1.2968129
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

SEM image of our T-branch junction. The dc is applied between side stems, and the voltages at three voltage probes—, , and —are measured.

Image of FIG. 2.
FIG. 2.

(a) The central probe voltage and (b) the device current vs the push-pull bias voltage for the mostly ballistic (solid line) and mostly diffusive (dashed line) modes of the TBJ operation.

Image of FIG. 3.
FIG. 3.

The derivative of with respect to the push-pull voltage . The temperature dependence of TBJs with (a) and (b) . The channel-length dependence at (c) and (d) .

Image of FIG. 4.
FIG. 4.

The channel-length dependence of (a) the ballisticity factor and (b) the onset voltage . Points represent our experimental data extracted from Figs. 2 and 3, while the star is a datum of the Monte Carlo simulation in Ref. 7. The lines are just guides for the eye.

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/content/aip/journal/apl/93/5/10.1063/1.2968129
2008-08-06
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nonlinear characteristics of T-branch junctions: Transition from ballistic to diffusive regime
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/5/10.1063/1.2968129
10.1063/1.2968129
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