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Characterization of laser-transferred bismuth ferrite lead titanate ferroelectric thick films
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10.1063/1.2969288
/content/aip/journal/apl/93/5/10.1063/1.2969288
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/5/10.1063/1.2969288

Figures

Image of FIG. 1.
FIG. 1.

Strain-electric field loop for a thick film of after laser processing, using a maximum drive field of . The total strain recorded was 0.09%.

Image of FIG. 2.
FIG. 2.

GAXRD patterns for laser processed surface of as a function of .

Image of FIG. 3.
FIG. 3.

The variation in peak intensity, expressed as an intensity ratio (see text for details), as a function of x-ray penetration depth.

Image of FIG. 4.
FIG. 4.

(a) SEM of the surface of an as-fired film tape cast and sintered on sapphire. (b) Laser processed interface, after release from sapphire.

Tables

Generic image for table
Table I.

Comparative residual strain and microstrain normal to sample surface for for a sintered polished and annealed bulk pellet, the as-fired surface of a BFPT film on a sapphire substrate, and the laser-released film surface after LTP onto platinized silicon.

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/content/aip/journal/apl/93/5/10.1063/1.2969288
2008-08-07
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of laser-transferred bismuth ferrite lead titanate ferroelectric thick films
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/5/10.1063/1.2969288
10.1063/1.2969288
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