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Strain-electric field loop for a thick film of after laser processing, using a maximum drive field of . The total strain recorded was 0.09%.
GAXRD patterns for laser processed surface of as a function of .
The variation in peak intensity, expressed as an intensity ratio (see text for details), as a function of x-ray penetration depth.
(a) SEM of the surface of an as-fired film tape cast and sintered on sapphire. (b) Laser processed interface, after release from sapphire.
Comparative residual strain and microstrain normal to sample surface for for a sintered polished and annealed bulk pellet, the as-fired surface of a BFPT film on a sapphire substrate, and the laser-released film surface after LTP onto platinized silicon.
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