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Local versus global absorption in thin-film solar cells with randomly textured surfaces
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View: Figures


Image of FIG. 2.
FIG. 2.

(a) Topography in nanometers of the surface with the modification that causes the highest global enhancement. (b) The local absorption enhancement at a wavelength of 780 nm.

Image of FIG. 1.
FIG. 1.

The top figure (a) shows the absorption enhancement at two representative wavelengths in a 250 nm layer conformally deposited on a rough ZnO surface as a function of a characteristic size parameter. As deducible from the lower figure (b), the size parameter corresponds to a normalized maximal depth of the rough profile etched into the structure. Lower figures show the light intensity at 780 nm inside the structure. The green lines indicate the subsequent transition from the quartz substrate, the ZnO layer, the layer, and finally into the air. The color scale is kept constant in all figures.

Image of FIG. 3.
FIG. 3.

Global absorption enhancement as a function of the normalized strength of a modified topography at a wavelength of 780 nm (a) and 658 nm (b). The various means to modify the surface profile are indicated in (c) where the size parameter is always 0.4. The light intensity there is shown at a wavelength of 780 nm. The solid blue line corresponds to a lower, the green dashed line to an upper threshold of the profile depth. The red dashed-dotted line corresponds to a decrease in the entire magnitude of the surface profile which converges toward a structure where the is deposited on top of a ZnO layer. The black dotted line shows the same but the system converges toward a single layer on top of the quartz substrate.


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Scitation: Local versus global absorption in thin-film solar cells with randomly textured surfaces