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(a) Diagram of the 1DPC with the grating on top. SEW are coupled in the Kretschmann configuration with TE-polarized illumination. (b) Calculated reflectance map of the corrugated 1DPC. Illumination is TE-polarized. Darker regions represent low reflectance. The numbered circles indicate the points considered in the SNOM analysis.
Cross-sectional profiles of topography, amplitude, and phase at (a) the low-frequency (point A) and (b) high-frequency (point B) band edges. The amplitude and phase are produced by TE-polarized illumination beam.
Cross-sectional profiles of topography, amplitude, and phase at optical frequencies and incident angles corresponding to (a) point C, (b) point D, and (c) point E. As shown in Fig. 1(b), the amplitude and phase are associated to an optical near-field produced by a TE-polarized illumination beam.
Normalized intensity distribution of the near-field obtained at the band edges. (a) TE and (b) TM-polarized incident beam at point B, (c) TE at point A. The illumination beam provides a spot of size .
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