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Cross-sectional TEM images of AlSb grown on miscut Si (001) substrate under (a) low-resolution, (b) high-resolution conditions, and (c) highlighted section of (b), featuring the periodic IMF array.
Series of schematics to elucidate atomic arrangement and resulting strain involved in AlSb on miscut Si. Part (a) shows the step geometry on a miscut Si substrate. Part (b) shows a “ball and stick” schematic of Al, Sb, and Si sublattices. Part (c) indicates sources of strain at the step edge due to the , mismatch.
Cross-sectional TEM image of AlSb grown on miscut Si (001) substrate under (a) low-resolution and (b) high-resolution conditions featuring defects and APDs.
Sample quality analysis of GaSb bulk nucleated via an AlSb IMF on miscut Si by cross-sectional TEM image.
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