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Simultaneous interfacial misfit array formation and antiphase domain suppression on miscut silicon substrate
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10.1063/1.2970997
/content/aip/journal/apl/93/7/10.1063/1.2970997
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/7/10.1063/1.2970997
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Cross-sectional TEM images of AlSb grown on miscut Si (001) substrate under (a) low-resolution, (b) high-resolution conditions, and (c) highlighted section of (b), featuring the periodic IMF array.

Image of FIG. 2.
FIG. 2.

Series of schematics to elucidate atomic arrangement and resulting strain involved in AlSb on miscut Si. Part (a) shows the step geometry on a miscut Si substrate. Part (b) shows a “ball and stick” schematic of Al, Sb, and Si sublattices. Part (c) indicates sources of strain at the step edge due to the , mismatch.

Image of FIG. 3.
FIG. 3.

Cross-sectional TEM image of AlSb grown on miscut Si (001) substrate under (a) low-resolution and (b) high-resolution conditions featuring defects and APDs.

Image of FIG. 4.
FIG. 4.

Sample quality analysis of GaSb bulk nucleated via an AlSb IMF on miscut Si by cross-sectional TEM image.

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/content/aip/journal/apl/93/7/10.1063/1.2970997
2008-08-18
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Simultaneous interfacial misfit array formation and antiphase domain suppression on miscut silicon substrate
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/7/10.1063/1.2970997
10.1063/1.2970997
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