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Wedgelike ultrathin epitaxial films for studies of scaling effects in ferroelectrics
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View: Figures


Image of FIG. 1.
FIG. 1.

(a) X-ray synchrotron radiation measurements performed at Hasylab (DESY) for several positions along the wedgelike film. The inset shows the film thickness and the out-of-plane lattice parameter of the film as a function of position along the wedge. (b) RBS spectra of two representative sections of the wedgelike film demonstrating constant composition along the wedge.

Image of FIG. 2.
FIG. 2.

Current response of the -thick ferroelectric capacitor with electrodes measured at . The black line shows the response measured at the excitation signal frequency of , whereas the square dots denote the current response measured at a frequency of . The circles show the difference between these two current-voltage curves, which represents the leakage-compensated current response. The area of the pad is .

Image of FIG. 3.
FIG. 3.

Thickness dependence of polarization in capacitors at . Squares show the remanent polarizations measured for an off-center-deposited wedgelike film. The solid line represents the theoretical dependence.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Wedgelike ultrathin epitaxial BaTiO3 films for studies of scaling effects in ferroelectrics