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Thickness dependence of space charge limited current and injection limited current in organic molecular semiconductors
10.X. Zhou, M. Pfeiffer, J. S. Huang, J. Blochwitz-Nimoth, D. S. Qin, A. Werner, J. Drechsel, B. Maennig, and K. Leo, Appl. Phys. Lett. 81, 922 (2002).
16.M. A. Lampert and P. Mark, Current Injection in Solids (Academic, New York, 1970).
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We report the experimental investigations on space charge limited current (SCLC) and injection limited current (ILC) in copper phthalocyanine (CuPc), sandwiched between two metal electrodes. Thickness dependence of current-voltage characteristics of SCLC and ILC is accurately reproduced by the electric field and temperature dependent charge carriermobility, without invoking charge density dependent mobility. These results are interpreted using a consistent description of SCLC and ILC, based on a unified model of hopping transport within Gaussian density of states in CuPc.
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