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Thickness-dependent structural and electrical properties of multiferroic Mn-doped thin films grown epitaxially by pulsed laser deposition
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10.1063/1.2969785
/content/aip/journal/apl/93/8/10.1063/1.2969785
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/8/10.1063/1.2969785
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD scan patterns of the BFMO thin films deposited on SRO-coated STO substrates with different film thicknesses. The peaks are indexed as for BFMO, for STO, and for SRO.

Image of FIG. 2.
FIG. 2.

(a) field hysteresis loops and corresponding electric field dependences of the current response for Au/BFMO (70 nm)/SRO capacitors. The measurement was performed at room temperature and at a frequency of 1 kHz. Leakage currents measured after a prepoling (b) for 5, 20, and 70 nm BFMO thin films plotted with (c) vs (Schottky) and (d) vs (FN). The lines are fits for the Schottky and FN models.

Image of FIG. 3.
FIG. 3.

CTAFM resistance mappings for (a) 5 nm BFMO film and (b) an undoped 5 nm BFO film, measured over scan area and with the samples biased at 3 V. Note that the resistance of the Mn-doped film () is much larger than the undoped one by roughly two orders of magnitude. (c) Piezoelectric response phase loop for the 5-nm-thick BFMO film.

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/content/aip/journal/apl/93/8/10.1063/1.2969785
2008-08-26
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thickness-dependent structural and electrical properties of multiferroic Mn-doped BiFeO3 thin films grown epitaxially by pulsed laser deposition
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/8/10.1063/1.2969785
10.1063/1.2969785
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