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Valence band offset of heterojunction measured by x-ray photoelectron spectroscopy
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10.1063/1.2977478
/content/aip/journal/apl/93/8/10.1063/1.2977478
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/8/10.1063/1.2977478
/content/aip/journal/apl/93/8/10.1063/1.2977478
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/content/aip/journal/apl/93/8/10.1063/1.2977478
2008-08-28
2014-09-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Valence band offset of ZnO/Zn0.85Mg0.15O heterojunction measured by x-ray photoelectron spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/8/10.1063/1.2977478
10.1063/1.2977478
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