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Typical characteristic of an annealed ITO/PVK/Al by sweeping the voltage from zero to maximum value and then back to zero on a semilogarithmic scale. The inset shows the currents of ON and OFF states measured continuously as a function of time for the annealed ITO/PVK/Al under a constant bias of 1.0 V.
Comparison of the characteristics of the devices based on the annealed and unannealed PVK.
Analysis of characteristics for the annealed ITO/PVK/Al device in (a) ON and (b) OFF states.
AFM morphology and phase images of PVK films on ITO. Among (a) and (c) are morphology and phase images of the annealed PVK and (b) and (d) are morphology and phase images of the unannealed PVK.
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