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(a) Schematic of the sample fabricated and studied, (b) topography constant force AFM scan of AlN, (c) characteristic study performed on bare AlN (inset: FN analysis), and (d) current vs bias data for different bias scan ranges.
(a) Constant force topographic AFM scan of ZnO surface. Current images obtained with (b) , (c) and (d) .
(a) characteristic study performed on the ZnO/AlN/Si(100) sample (inset: force-distance curve), (b) FN analysis performed on the curve, (c) variation in percentage coverage area with respect to applied bias, and (d) variation in current with respect to force. The red line is the theoretical fit using the Hertzian model.
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