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Ultrathin epitaxially grown bismuth (111) membranes
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10.1063/1.2976558
/content/aip/journal/apl/93/9/10.1063/1.2976558
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/9/10.1063/1.2976558
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

AFM Image of the NaCl crystal; (a) before polishing, pronounced roughness is visible (height range of 60 nm); (b) polished surface with a few single atomic steps ready for deposition (height range of 3 nm); and (c) LEED pattern recorded at 77 eV showing the clean NaCl (001) surface.

Image of FIG. 2.
FIG. 2.

AFM image of a 30 nm thick Bi film on top of a NaCl crystal (height range of 4 nm); (b) histogram showing the sharp height distribution and absence of holes or islands; and (c) LEED pattern recorded at 90 eV showing two domains of (111) oriented bismuth.

Image of FIG. 3.
FIG. 3.

TED pattern (intensity scale inverted for better visibility) from a 20 nm Bi film with 30 keV electron energy. The quasi-12-fold pattern originates from superposition of two domains of (111)-oriented bismuth that are rotated by with respect to each other. Pattern indices are in hexagonal nomenclature for one of the two domains. Faintly visible spots in fourfold symmetry are attributed to NaCl remnants at the former NaCl/Bi interface.

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/content/aip/journal/apl/93/9/10.1063/1.2976558
2008-09-03
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ultrathin epitaxially grown bismuth (111) membranes
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/9/10.1063/1.2976558
10.1063/1.2976558
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